The need for small size, flexibility and integration in most manufacturing environments is developing a new idea of automated test systems or ATE.

For this reason, SEICA has created the new Compact Cube Next>Series: it is the smallest of the Compactfamily, but with great potential in the different operational environments.

Ate Resources –ICT & Functional Testing

The Compact Cube test system uses the VIP platform (ACL-VIVA), whose main feature is the possibility to deliver the best integration of technology and easiness of use.

It is possible to combine the following test solutions:

  • ICT (In Circuit Test), Functional test,
  • On-board programming
  • Boundary-Scan test.

This is possible thanks to the cutting-edge measurement system (based on ACL proprietary module) and to the Viva Next management software. The ACL module contains the internal instruments providing the drive and sense capabilities. These are optimized to provide increased accuracy and the possibility to program drivers. The communication to the Main PC via optical fiber cable minimizes sensitiveness to external disturbances. The user can benefit from an intuitive graphical software interface designed for compiling and running functional tests: Quick Test.

You can use our Whatsapp support line to get information.