Video

Compact Line In

The most recent innovations in digital components require a more sophisticated digital tester featuring capabilities that go beyond the simple logic analyzer. Industrial manufacturing requires processing capabilities at the hardware level to speed up test times. At the same time, the new logic families, based on featuring variable voltage levels and single or differential signals continue to make these even more complex.
The tester designated as Compact Digital Test System (DTS) Next series is Seica response to the constant demand for testing integrated devices via vector-based techniques and dedicated protocols such as Boundary Scan, without excluding the need to combine the in-circuit test as well.

You can use our Whatsapp support line to get information.