ETSP-DC series are designed to test a component’s resistance to a dust-filled environment as defined in Dust Test Specifications such as SAE J-575, IEC 60068-2-68, DIN/VDE 0470 parts 1 (EN 60529). The product is placed on the specimen rack and dust is agitated through the chamber by injecting compressed air into each of the dust through. The dust then settles, covering the product under test.