Quadra Pro series produces unmatched ultra high definition images. The internally developed, high-efficiency Dual Mode NT4 X-ray tube and the Onyx detector deliver clarity of even the smallest details and detect defects instantly.

The Quadra™ 7 Pro establishes a new benchmark for 3D/2D manual inspection with enhanced resolution for back-end semiconductor processes. Integrated with the groundbreaking Onyx detector technology, it ensures outstanding image sharpness and minimized noise levels, raising the inspection process to the highest degree of precision and performance.

The Quadra 7 Pro features the latest Dual Mode Quadra NT4 tube, delivering users maximum adaptability. This advanced option provides brightness and resolution settings, enabling operators to seamlessly alternate between them according to specific application needs.

Along with its advanced hardware, the Quadra 7 Pro includes the newly introduced Revalution™ software. Developed particularly for advanced semiconductor use, Revalution™ software improves the user experience with a user-friendly interface, streamlined workflow, and extended capabilities. It allows operators to quickly evaluate and understand inspection data, supporting faster decisions and greater overall efficiency.