Compact Cube Next

The need for small size, flexibility, and seamless integration in most manufacturing environments is driving the development of a new generation of automated test systems (ATE). To address this demand, the new Compact CUBE NEXT>SERIES has been developed. While it represents the smallest footprint within the Compact family, it delivers substantial operational potential across diverse production environments.

Ate Resources – ICT & Functional Testing The test system utilizes the VIP platform (ACL-VIVA), which is engineered to deliver an optimal combination of advanced technology and ease of use. This architecture enables the integration of multiple testing methodologies, including ICT (In-Circuit Test), functional testing, on-board programming, and Boundary-Scan testing. This multi-functional capability is powered by a cutting-edge measurement system based on the proprietary ACL module, paired with the VIVANEXT> management software.

The ACL module houses internal instrumentation that provides high-precision drive and sense capabilities. Additionally, data communication to the Main PC is routed via an optical fiber cable to minimize sensitivity to external electromagnetic disturbances. Users can also utilize Quick Test, an intuitive graphical software interface designed for compiling and executing functional tests in a simplified manner.

 

Key Features of Compact Cube Next

The “Flexibility” of a Truly Open and Customizable Test Platform The concept of an open system is extensively integrated into the ATEs of the Compact CUBE. The VIVA NEXT> language enables seamless integration between the VIVA NEXT> environment and the NI LabViewTM/TestStandTM platform. These software diversities link directly to TestStandTM variants and are managed by the Variant Manager. A dedicated LabVIEWTM library controls the SEICA instruments, serving as the bridge between VIVA NEXT> and the NI software world. Additionally, the My View software component allows users to create a customizable and localizable MMI (Multi Media Interface). Users can read from and write to the MyView controls at runtime directly from the TestStand sequence. Furthermore, the platform supports the execution of python .NET code (IronPython) from the TestStand sequence, complemented by a customizable interface on top of the machine.

Different Configurations for an Enhanced Implementation The digital section of a Compact CUBE tester can be configured to meet distinct technical requirements and achieve optimal performance through four separate configurations: Analog channel connection allows the management of 192 analog channels if the three available slots are occupied by three S64 boards. Direct digital channel connection of the F50 board ensures the available system resources are fully digital when the three available slots house three F50 boards. Hybrid channels combine F50 and S64 boards to make all digital and analog resources of the tester available on the test points.

The “Compactness” of a Truly Integrated Solution The Compact CUBE is engineered to fit specific efficiency requirements within a small, customizable footprint. – In under 68 cm in height, a total of 12 rack units are integrated. Seven units are utilized by the system, leaving 5 rack units (divided into 3+2 units) available for additional instruments. – The design provides immediate and simple in-line automation integration, facilitated by four pivoting wheels for smooth mobility. – The instruments contained within the system are easily removable via front and rear access, guaranteeing rapid maintenance.

Industry 4.0 Information and the technology required to collect and analyze data are key to the successful digitalization of the manufacturing process, which forms the core of the Industry 4.0 concept. The Compact line possesses all the capabilities needed for implementation in any Factory 4.0 scenario, offering the possibility to connect with any proprietary or third-party information system to achieve production goals.

The COMPACT Line is designed to offer maximum configurability, enabling users to choose the most suitable setup for their application—whether an in-circuit tester, a functional test bench, or a fully automated solution integrated directly into the production line.

The COMPACT Line is designed to offer maximum configurability, enabling users to choose the most suitable setup for their application—whether an in-circuit tester, a functional test bench, or a fully automated solution integrated directly into the production line.

Innovation, High Performance, Flexibility and Throughput
Engineered according to lean production principles, the Compact Line specifically addresses the needs of electronic board manufacturing environments. It is ergonomically refined and technologically competitive, delivering high flexibility, excellent measurement accuracy, fast test execution, and minimal footprint, all with low power consumption to provide a cutting-edge and sustainable solution.

Compact systems are ideal for:
1. Analog and digital in-circuit testing
2. Analog, digital and power functional testing
3. Boundary Scan testing
4. Digital device programming (microcontrollers, memories, etc.)
5. High-voltage testing

Focused on optimizing test costs, the Compact Line emphasizes space reduction, reduced test times, and minimized waste, while remaining fully compatible with test programs and fixtures from the Strategy Line.

Every Compact Line system is built on the Seica VIP Platform, which includes ACL synthesized drive/sense instruments and the VIVA test management software. When required, Compact systems can also be controlled using alternative software suites such as National Instruments LabVIEW™, LabWindows™/CVI, or TestStand™.

If new requirements arise for performance or ergonomics, Seica can deliver customized Compact solutions, integrating third-party tools or developing dedicated hardware and software modules tailored to the customer's specific needs.

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