Compact Multi
This configuration is highly recommended for pre-functional, functional, and combinational testing procedures. Due to its versatility and scalability, the Compact MULTI test system seamlessly integrates external instrumentation, advanced capabilities, and specialized techniques into a single, unified test program.
The system is ideal for implementing functional test benches for various equipment types and electronic boards. With a reduced physical footprint and full compliance with WCM standards, it supports the deployment of multiple adjacent cabinets, enabling the creation of complex test benches across diverse electronics sectors.
Compact Multi is particularly suitable for:
The Compact Multi system is engineered to address the following testing applications:
- Board functional test
- Equipment EOL test
- On-board programming
- ICT/fun combinational test
- Automated final test
- Implementation of automated test sequence
Features:
- Incorporates an analog bus and matrix, utilizing S64N, S64A, and S64F configurations.
- Features a power bus and matrix supported by the HRELE module.
- Utilizes a digital bus alongside P32 hybrid channel boards.
- Supports the configuration of up to 12 DC power supplies, including APx and ALx series.
- Integrates proprietary instruments directly on the ACL module.
- Enables seamless integration of off-the-shelf instruments.
- Includes a universal on-board programmer capable of managing up to 8 units in parallel.
- Manages various communication protocols such as Serial, USB, CAN, LIN, K-line, and GPIB.
- Executes functional test sequences utilizing National Instruments Labview and Teststand operating systems.
- Runs ICT or functional test sequences via the SEICA VIVA operating system.
- Provides automated self-test capabilities at the module level.
- Accommodates a receiver configured with or without upper contrasts.
- Features a dedicated ODU connector interface.
- Coordinates barcode and 2D code reading management.
- Handles automatic statistic data collection for analysis.
The Compact Line is designed to offer maximum configurability, enabling users to choose the most suitable setup for their application—whether an in-circuit tester, a functional test bench, or a fully automated solution integrated directly into the production line.
Innovation, High Performance, Flexibility, and Throughput
Engineered according to lean production principles, the Compact Line specifically addresses the needs of electronic board manufacturing environments.
It is ergonomically refined and technologically competitive, delivering high flexibility, excellent measurement accuracy, fast test execution, and minimal footprint, all with low power consumption to provide a cutting-edge and sustainable solution.
Compact systems are ideal for:
1. Analog and digital in-circuit testing
2. Analog, digital and power functional testing
3. Boundary Scan testing
4. Digital device programming (microcontrollers, memories, etc.)
5. High-voltage testing
Focused on optimizing test costs, the Compact Line emphasizes space reduction, reduced test times, and minimized waste, while remaining fully compatible with test programs and fixtures from the Strategy Line.
Every Compact Line system is built on the Seica VIP Platform, which includes ACL synthesized drive/sense instruments and the VIVA test management software. When required, Compact systems can also be controlled using alternative software suites such as National Instruments LabVIEW™, LabWindows™/CVI, or TestStand™.
If new requirements arise for performance or ergonomics, Seica can deliver customized Compact solutions, integrating third-party tools or developing dedicated hardware and software modules tailored to the customer's specific needs.