Compact Digital XL Next
The Compact Digital XL Test system is equipped with a vacuum-type receiver designed for manual or automated loading and unloading of the UUTs. This platform offers a configurable, full-range test solution, spanning from MDA/ICT to full functional tests of complex digital boards, boundary-scan testing, and on-board programming. Like all Seica solutions, the system is based on the VIP platform (Viva Integrated Platform). It integrates advanced hardware and software capabilities within a completely integrated, user-friendly environment to deliver the high-level test performances required by modern electronics.
The VIVA Next> 64-bit software provides a comprehensive set of utilities and tools specifically designed to manage all aspects of testing. It features a Test Studio environment that allows users to develop functional test sequences using preferred programming tools, such as VIVA VL, VIVA Quicktest, VIVA Flylab, TestStand, Labview, MS Excel, or Python. VIVA NEXT ensures intelligent integration with various manufacturing processes, including data collection, traceability, MES interaction, and repair operations.
Furthermore, all Next> series systems incorporate Canavisia’s Industrial Monitoring solution, enabling remote monitoring of current, voltage consumption, mains supply, temperature, and light indicators. These parameters confirm correct operation, provide critical data for predictive maintenance, and ensure compatibility with modern Industry 4.0 standards.
The COMPACT Line is designed to offer maximum configurability, enabling users to choose the most suitable setup for their application—whether an in-circuit tester, a functional test bench, or a fully automated solution integrated directly into the production line.
The COMPACT Line is designed to offer maximum configurability, enabling users to choose the most suitable setup for their application—whether an in-circuit tester, a functional test bench, or a fully automated solution integrated directly into the production line.
Innovation, High Performance, Flexibility and Throughput
Engineered according to lean production principles, the Compact Line specifically addresses the needs of electronic board manufacturing environments.
It is ergonomically refined and technologically competitive, delivering high flexibility, excellent measurement accuracy, fast test execution, and minimal footprint, all with low power consumption to provide a cutting-edge and sustainable solution.
Compact systems are ideal for:
1. Analog and digital in-circuit testing
2. Analog, digital and power functional testing
3. Boundary Scan testing
4. Digital device programming (microcontrollers, memories, etc.)
5. High-voltage testing
Focused on optimizing test costs, the Compact Line emphasizes space reduction, reduced test times, and minimized waste, while remaining fully compatible with test programs and fixtures from the Strategy Line.
Every Compact Line system is built on the Seica VIP Platform, which includes ACL synthesized drive/sense instruments and the VIVA test management software. When required, Compact systems can also be controlled using alternative software suites such as National Instruments LabVIEW™, LabWindows™/CVI, or TestStand™.
If new requirements arise for performance or ergonomics, Seica can deliver customized Compact solutions, integrating third-party tools or developing dedicated hardware and software modules tailored to the customer's specific needs.
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